Pan, Qitao. “VNA-Based Insertion Loss and Return Loss Testing and De-Embedding Techniques for High-Speed Serial Links on PCBs”. International Journal of Engineering Advances 2, no. 3 (November 30, 2025): 93–100. Accessed December 19, 2025. https://www.gbspress.com/index.php/IJEA/article/view/512.