GUO, Mingde. LLM Supported Complex System Anomaly Detection and Intelligent Defect Classification Model. International Journal of Engineering Advances, [S. l.], v. 3, n. 1, p. 1–7, 2026. DOI: 10.71222/x7nj2a82. Disponível em: https://www.gbspress.com/index.php/IJEA/article/view/554. Acesso em: 4 feb. 2026.