PAN, Qitao. VNA-based Insertion Loss and Return Loss Testing and De-embedding Techniques for High-Speed Serial Links on PCBs. International Journal of Engineering Advances, [S. l.], v. 2, n. 3, p. 93–100, 2025. DOI: 10.71222/77tz0j28. Disponível em: https://www.gbspress.com/index.php/IJEA/article/view/512. Acesso em: 19 dec. 2025.